Curto Lab – UGent and imec

Nano-Optics lab at UGent-imec. Alberto G. Curto – Ghent. Chiral sensing, 2D Semiconductor Nanophotonics, Nanophotonic materials, Optical metrology

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Metrology in Photonics Spectra

Photonics Spectra has published an article about metasurface metrology, including our opinion on nanophotonics for metrology applications.

Read it here

Curto Lab

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2024-10-24 by Alberto G. Curto hybrid metasurfaces, metrology

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